Publications of F. Keilmann

Keilmann, F.; Huber, A. J.; Hillenbrand, R.: Nanoscale Conductivity Contrast by Scattering-Type Near-Field Optical Microscopy in the Visible, Infrared and THz Domains. Journal of Infrared Millimeter and Terahertz Waves 30 (12), pp. 1255 - 1268 (2009)

Frenzel, A.; Qazilbash, M. M.; Brehm, M.; Chae, B. G.; Kim, B. J.; Kim, H. T.; Balatsky, A. V.; Keilmann, F.; Basov, D. N.: Inhomogeneous electronic state near the insulator-to-metal transition in the correlated oxide VO2. Physical Review B 80 (11), 115115, pp. [1] - [7] (2009)

Qazilbash, M. M.; Brehm, M.; Andreev, G. O.; Frenzel, A.; Ho, P. C.; Chae, B. G.; Kim, B. J.; Yun, S. J.; Kim, H. T.; Balatsky, A. V. et al.; Shpyrko, O. G.; Maple, M. B.; Keilmann, F.; Basov, D. N.: Infrared spectroscopy and nano-imaging of the insulator-to-metal transition in vanadium dioxide. Physical Review B 79 (7), 075107, pp. [075107-1] - [075107-10] (2009)

Ganz, T.; Brehm, M.; von Ribbeck, H. G.; van der Weide, D. W.; Keilmann, F.: Vector frequency-comb Fourier-transform spectroscopy for characterizing metamaterials. New Journal of Physics 10, 123007, pp. [1] - [14] (2008)

Huber, A. J.; Keilmann, F.; Wittborn, J.; Aizpurua, J.; Hillenbrand, R.: Terahertz Near-Field Nanoscopy of Mobile Carriers in Single Semiconductor Nanodevices. Nano Letters 8 (11), pp. 3766 - 3770 (2008)

Brehm, M.; Schliesser, A.; Cajko, F.; Tsukerman, I.; Keilmann, F.: Antenna-mediated back-scattering efficiency in infrared near-field microscopy. Optics Express 16 (15), pp. 11203 - 11215 (2008)

Ganz, T.; von Ribbeck, H. G.; Brehm, M.; Keilmann, F.: Compact frequency-comb Fourier-transform infrared spectrometer. Optics Communications 281 (14), pp. 3827 - 3830 (2008)

Driscoll, T.; Palit, S.; Qazilbash, M. M.; Brehm, M.; Keilmann, F.; Chae, B. G.; Yun, S. J.; Kim, H. T.; Cho, S. Y.; Jokerst, N. M. et al.; Smith, D. R.; Basov, D. N.: Dynamic tuning of an infrared hybrid-metamaterial resonance using vanadium dioxide. Applied Physics Letters 93 (2), 024101, pp. 024101-1 - 024101-3 (2008)

Qazilbash, M. M.; Li, Z. Q.; Podzorov, V.; Brehm, M.; Keilmann, F.; Chae, B. G.; Kim, H. T.; Basov, D. N.: Electrostatic modification of infrared response in gated structures based on VO2. Applied Physics Letters 92 (24), 241906 (2008)

von Ribbeck, H. G.; Brehm, M.; van der Weide, D. W.; Winnerl, S.; Drachenko, O.; Helm, M.; Keilmann, F.: Spectroscopic THz near-field microscope. Optics Express 16 (5), pp. 3430 - 3438 (2008)

Keilmann, F.: Asymmetric comb-FTIR for Characterizing Metamaterials. 2008 33rd International Conference on Infrared, Millimeter and Terahertz Waves, Vols 1 and 2, p. 405 - 405 (2008)

Keilmann, F.; Hillenbrand, R.: Nanoscale Infrared&THz Mapping of Conductivity. 2008 33rd International Conference on Infrared, Millimeter and Terahertz Waves, Vols 1 and 2, p. 406 - 406 (2008)

Qazilbash, M. M.; Brehm, M.; Chae, B. G.; Ho, P. C.; Andreev, G. O.; Kim, B. J.; Yun, S. J.; Balatsky, A. V.; Maple, M. B.; Keilmann, F. et al.; Kim, H. T.; Basov, D. N.: Mott transition in VO2 revealed by infrared spectroscopy and nano-imaging. Science 318 (5857), pp. 1750 - 1753 (2007)

Huber, A. J.; Kazantsev, D.; Keilmann, F.; Wittborn, J.; Hillenbrand, R.: Simultaneous IR material recognition and conductivity mapping by nanoscale near-field microscopy. Advanced Materials 19 (17), pp. 2209 - 2212 (2007)

Brehm, M.; Schliesser, A.; Keilmann, F.: Spectroscopic near-field microscopy using frequency combs in the mid-infrared. Optics Express 14, pp. 11222 - 11233 (2006)

Brehm, M.; Taubner, T.; Hillenbrand, R.; Keilmann, F.: Infrared spectroscopic mapping of single nanoparticles and viruses at nanoscale resolution. Nano Letters 6 (7), pp. 1307 - 1310 (2006)

Schliesser, A.; Brehm, M.; Keilmann, F.; van der Weide, D. W.: Frequency-comb infrared spectrometer for rapid, remote chemical sensing. Optics Express 13 (22), pp. 9029 - 9038 (2005)

Taubner, T.; Keilmann, F.; Hillenbrand, R.: Nanoscale-resolved subsurface imaging by scattering-type near-field optical microscopy. Optics Express 13 (22), pp. 8893 - 8899 (2005)

Brehm, M.; Frey, H. G.; Guckenberger, R.; Hillenbrand, R.; Kazantsev, D.; Keilmann, F.; Ocelic, N.; Taubner, T.: Consolidating apertureless SNOM. Journal of the Korean Physical Society 47, pp. S80 - S85 (2005)

Taubner, T.; Keilmann, F.; Hillenbrand, R.: Effect of tip modulation on image contrast in scattering-type near-field optical microscopy. Journal of the Korean Physical Society 47 (Suppl. Suppl. 1), pp. S213 - S216 (2005)